Change racks facilitate exchanging of probe sensors automatically during part inspection reducing measurement time required with the use of CMM as a single inspection tool.
Features & Benefits
Mitutoyo offers a wide array of probe change racks that change CMM styli and probe heads for faster, automated measurements in a single machine. There are probe change racks for manual and automated probe and styli changes at different speeds with integrated stylus safety parameters.
Product List
| Order No.: | Change Rack: |
Product Image: | Exchange Type: |
Mounting Type: |
CMM Type: |
Supported Sensors: |
|---|---|---|---|---|---|---|
| 54SAA005 | SCRÂ 200 | - | Stylus Module | Integrated Support Leg | CNC | TP200: SF, MF, TP200B |
| A-1371-0261 | MCR20 | - | Stylus Module | Integrated Support Leg | CNC | TP20: LF, SF, MF, EF, 6W, EM1, EM2 |
| A-1371-1001 | TCR20 | - | Stylus Module | Integrated Support Leg | CNC | PH20 |
| A-2237-1401 | FCR25 | - | Scanning Module, Stylus Holder, TP20 Module | MRS | CNC | SM25-1~5, SH25-1~5, TM25-20 |
| A-2237-1403 | FCR25 L3 | - | Scanning Module, Stylus Holder, TP20 Module | Integrated Support Leg | CNC | SM25-1~5, SH25-1~5, TM25-20 |
| A-2237-1406 | FCR25 L6 | - | Scanning Module, Stylus Holder, TP20 Module | Integrated Support Leg | CNC | SM25-1~5, SH25-1~5, TM25-20 |
| A-2237-1408 | FCR25TC | - | Scanning Module | MRS | CNC | SM25-1~5 |
| A-5036-0005 | ACR3 | - | Probe | MRS | CNC | TP20, TP200 (Tactile), SP25M (Scanning), SurfaceMeasure (Laser), SurfTest (Roughness), QVP (Optical) |
| A-5036-0172 | ACR3TC | - | Probe | MRS | CNC | TP20, TP200 (Tactile), SP25M (Scanning), SurfaceMeasure (Laser), SurfTest (Roughness), QVP (Optical) |