The Mitutoyo series of FS70 microscope heads for semiconductor inspection function as optimum compact microscope units for semiconductor probe stations. Capable of magnifications up to 8,000x and working distances up to 34mm, our microscope heads are ideal for inspection and quality assurance applications.
Ergonomic High-Power Inspection
Our FS70 finescope unit is compatible with YAG lasers and infrared optical systems. With an inward turret design and long working-distance objectives, our compact microscope units yield high magnifications for a wide range of semiconductor inspection applications.
Ergonomic high-power units for semiconductor observation
Compatible with infrared optical systems
Available for a wide range of observations
Product Series
Ergonomic High-power Semiconductor Inspection Microscope Unit
Ergonomic High-power Semiconductor Inspection Microscope Unit
Ergonomic High-power Semiconductor Inspection Microscope Unit
Ergonomic High-power Semiconductor Inspection Microscope Unit