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Microscope Head for Semi Conductor Inspection

The FS70 series is ideal as a microscope unit for a semiconductor probe station.

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Features & Benefits

The FS70 high-power microscope unit series delivers high magnifications with simultaneous video and binocular viewing of the erect image. A rubber-gripped coarse adjustment knob, enlarged fine-focus adjustment wheel and inward revolver for a longer working distance makes operating the FS70 easier.

•Bright field, differential interference contrast (DIC) and polarized observations are optional with FS70Z and FS70 (FS70L and FS70L4 do not support the DIC method)
• FS70 – Main Body (Non-Laser) with 1X- tube lens

SERIES 378 Technical Data
Focus Adjustment: 50 mm travel range with concentric coarse ( 3.8mm/rev) and fine (0.1mm/rev) focusing wheels ( right/left )
Projected Image: Erect
Pupil distance: Siedentopf type, adjustment range: 2-3" /51-76mm
Field number: 24
: -
Objective, optional (for observation): M Plan Apo, M Plan Apo SL, G Plan Apo
Tube Lens: 1x
Camera mount: C-mount (using optional adapter B )
Function

Eyepieces, Objectives and Illumination sold separately

Product List
Order No.: Product Image: Model: Tilt angle: Optical Pass Ratio: Loading weight: Mass:
378-184-1 - FS70 N/A 50/50 32lbs / 14.5kg 13 lbs. / 6.1kg
378-184-2 - FS70-S N/A 50/50 32lbs / 14.5kg 13 lbs. / 6.1kg
378-184-3 - FS70-TH 0-20 degree 100/0 or 0/100 30lbs / 13.6kg 15.5 lbs. / 7.1kg
378-184-4 - FS70-THS 0-20 degree 100/0 or 0/100 30lbs / 13.6kg 15.5 lbs. / 7.1kg