The FS70L series expands the scope of laser applications and is ideal as a microscope unit for a semiconductor probe station.
Series 378
Microscope Head for Semi Conductor Inspection ( Laser Applications at 355nm, 532nm, and 1064nm )
Features & Benefits
The FS70L high-power microscope unit series delivers high magnifications with video and binocular viewing of the erect image. A rubber-gripped coarse adjustment knob, enlarged fine-focus adjustment wheel and inward revolver for a longer working distance makes operating the FS70L4 easier.
• The FS70L4 supports two types of wavelength ranges (532nm and 266nm), expanding a scope of laser allowing laser-cutting of thin-films used in semiconductors and liquid crystal substrates
•Bright field, differential interference contrast (DIC) and polarized observations are optional with FS70Z and FS70 (FS70L and FS70L4 do not support the DIC method)
• FS70L4 – Main Body 1X for Two Wave Length Ranges 532/266nm
SERIES 378 Technical Data
| Projected Image: | Erect |
|---|---|
| Pupil distance: | Siedentopf type, adjustment range: 2-3" /51-76mm |
| Field number: | 24 |
| : | - |
| Objective, optional (for observation): | M Plan Apo, M Plan Apo SL, G Plan Apo |
| Tube Lens: | 1x |
| Camera mount: | Can be mounted on laser port |
| Objective, optional (for laser cutting ): | M/LCD Plan NIR, M/LCD Plan NUV |
| Applicable laser: | 1064/532/355nm |
| Protective filter: | Built-in laser beam filter |
Function
Eyepieces, Objectives and Illumination sold separately
Product List
| Order No.: | Product Image: | Model: | Tilt angle: | Optical Pass Ratio: | Loading weight: | Mass: |
|---|---|---|---|---|---|---|
| 378-186-1 | - | FS70L | N/A | 100/0 or 0/100 | 31lbs / 14.2kg | 14 lbs. / 6.4kg |
| 378-186-2 | - | FS70L-S | N/A | 100/0 or 0/101 | 31lbs / 14.2kg | 14 lbs. / 6.4kg |
| 378-186-3 | - | FS70L-TH | 0-20 degree | 100/0 or 0/102 | 30lbs / 13.5kg | 15.5 lbs. / 7.2kg |
| 378-186-4 | - | FS70L-THS | 0-20 degree | 100/0 or 0/103 | 30lbs / 13.5kg | 15.5 lbs. / 7.2kg |